Journal of Terahertz Science and Electronic Information Technology , Volume. 19, Issue 1, 176(2021)

Geant4 simulation of displacement damage induced by proton irradiation in InP

BAI Yurong*, HE Chaohui, XIE Fei, LI Yonghong, and ZANG Hang
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    References(10)

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    [4] [4] ROMERO M J,WALTERS R J,ARAúJO D,et al. Proton-induced damage in p-n InP solar cells:the role of electron capture at high fluences[J]. Materials Science and Engineering, 2001,80(1-3):294-298.

    [5] [5] RAINE M,JAY A,RICHARD N,et al. Simulation of single particle displacement damage in silicon-part I:global approach and primary interaction simulation[J]. IEEE Transactions on Nuclear Science, 2017,64(1):133-140.

    [7] [7] ZHAO Xiaohong,LU Hongliang,ZHANG Yuming,et al. Model of phonon contribution to Non-Ionizing Energy Loss(NIEL) for InP/InGaAs heterojunction[J]. Microelectronics Reliability, 2017(78):156-160.

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    BAI Yurong, HE Chaohui, XIE Fei, LI Yonghong, ZANG Hang. Geant4 simulation of displacement damage induced by proton irradiation in InP[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(1): 176

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    Paper Information

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    Received: Oct. 10, 2019

    Accepted: --

    Published Online: Apr. 21, 2021

    The Author Email: Yurong BAI (baiyur@stu.xjtu.edu.cn)

    DOI:10.11805/tkyda2019383

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