Optical Communication Technology, Volume. 47, Issue 6, 38(2023)
Active Bias-T circuit for testing silicon-based high-speed modulator
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CHEN Bichao, ZHAO Heng. Active Bias-T circuit for testing silicon-based high-speed modulator[J]. Optical Communication Technology, 2023, 47(6): 38
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Received: Mar. 28, 2023
Accepted: --
Published Online: Feb. 2, 2024
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