Laser & Optoelectronics Progress, Volume. 50, Issue 1, 11201(2013)

Accurate Measurement of the Prism Refractive Index by Use of Total Reflection Principle

Zhou Jinzhao*, Cheng Zhiqing, and Huang Zuohua
Author Affiliations
  • [in Chinese]
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    References(17)

    [1] [1] D. L. Wood, J. W. Fleming. Computerized refractive index measurement for bulk materials at U V, visible, and IR wavelengths[J]. Rev. Sci. Instrum., 1982, 53(1): 43~47

    [2] [2] Mi Baoyong. Photo electric automatic refractometer with high precision in the wavelength range 365~1200 nm[J]. Opt. & Precision Engng., 1998, 6(3): 79~84

    [3] [3] R. P. Edwn, M. T. Dudemel, M. Lamarem. Refractive inedx measurement of ten germanium samples[J]. Appl. Opt., 1982, 21(5): 878~811

    [4] [4] J. C. Bhattacharya. Refracive index measurement[J]. Optics and Laser Technology, 1987, 19(1): 29~32

    [5] [5] H. Onodera, I. Awai, J. I. Lkenoue. Refractive index measurement of bulk materials:prism coupling method [J]. Appl. Opt., 1982, 22(8): 1944~1947

    [6] [6] P. K. Tien, R. Ulrioh.Theory of prism-film coupler and thin-film light guides [J]. J. Opt. Soc. Am., 1970, 60(10): 1325~1337

    [8] [8] Wang Zhijiang. Optical Technology Handbook[M]. Bejing: China Machine Press, 1994. 89~103

    [9] [9] Ji Yanjun, Du Yujie, Guo Hongyan. Index of refraction of prism using the holoreflecting method[J]. Physical Experiment of College, 2010, 23(6): 23~24

    [10] [10] Li Jing, Lei Yanxiang, Xia Qingsheng et al.. Measurement on the refractive indices of Yb3+ laser glasses by the prism method[J]. J. Qufu Normal University, 1998, 24(3): 46~48

    [11] [11] Huang Zuohua, He Zhenjiang, Yang Guanling et al.. The multifunctional ellipsometer [J]. Optical Technique, 2001, 27(9): 432~434

    [12] [12] Huang Zuohua, He Zhenjiang. The optical methods for measuring the thickness and refractive index of thin films[J]. Modern Scientific Instruments, 2003, (4): 42~44

    [13] [13] Li Hui, Xie Shusen, Qiu Yishen. Using the focused light to determine the refractive index of materials by total internal raflection[J]. Applied Laser, 1996, 16(6): 258~260

    [14] [14] Y. L. Jin, J. Y. Chen, L. Xu et al.. Refractive index measurement for biomaterial samples by total reflection[J]. Phys. Med. Biol., 2006, 51(20): 371~379

    [15] [15] Cui Naidi, Liang Jingqiu, Liang Zhongzhu et al.. Photonic crystal single channel side-coupled waveguide with parallel resonators[J]. Acta Optica Sinica, 2012, 32(2): 0223001

    [16] [16] Wang Jiaxian, Li Junjie, Wu Wenguang et al.. Coupled-mode characteristics of coupled-microdisks and single microdisk cavity with an output waveguide[J]. Acta Optica Sinica, 2011, 31(1): 0106006

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    [2] Meng Yun, Yan Baoluo, Fan Daihe, Jia Xinyan, Liu Qijun, Wei Yun. Accurate Measurement of Refractive Index of Triangular Prism[J]. Laser & Optoelectronics Progress, 2017, 54(12): 121201

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    Zhou Jinzhao, Cheng Zhiqing, Huang Zuohua. Accurate Measurement of the Prism Refractive Index by Use of Total Reflection Principle[J]. Laser & Optoelectronics Progress, 2013, 50(1): 11201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 30, 2012

    Accepted: --

    Published Online: Oct. 25, 2012

    The Author Email: Jinzhao Zhou (zzzhoujinzhao@126.com)

    DOI:10.3788/lop50.011201

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