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Optics and Precision Engineering, Volume. 15, Issue 2, 272(2007)

Preprocess algorithm of PCB line detection

[in Chinese]... [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)
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    [1] [1] DARWISH A M,JIAN A K.A rule based approach for visual pattern inspection[J].IEEE Trans.Pattern Anal.Mach.Intell.,1998:10(1):56-68.

    [2] [2] KOO J H,YOO S I.A structural matching for two-dimensional visual pattern inspection[C].IEEE International Conference on Systems,Man,and Cybernetics,1998,l5:4429-4434.

    [8] [8] MALLAT SG.A theory for multiresolution signal decomposition:the wavelet representation[J].IEEE Trans.Pattern Anal.Mach.Intell.,1989,11 (7):674-693.

    CLP Journals

    [1] WU Fu-pei, KUANG Yong-cong, ZHANG Xian-min, OUYANG Gao-fei. Pattern matching and parameter adaptive based PCB solder joint inspection[J]. Optics and Precision Engineering, 2009, 17(10): 2586

    [2] CHEN Li-heng, WU Qing-wen, LUO Zhi-tao, DONG Ji-hong, JIANG Fan. Design for thermal control system of electronic equipment in space camera[J]. Optics and Precision Engineering, 2009, 17(9): 2145

    [3] WU Hui-hui, ZHANG Xian-min, HONG Shi-liang. Inspection of surface mounted IC devices with edge and color features[J]. Optics and Precision Engineering, 2009, 17(9): 2283

    [4] SUN Chun-feng, YUAN Feng. Partially overlapped sub-block histogram equalization based on recursive equal area separateness[J]. Optics and Precision Engineering, 2009, 17(9): 2292

    [5] HUANG Da-qing, Li Bo. Novel tailoring method for conducting and radiating electromagnetic compatibility testing of unmanned aerial vehicle[J]. Optics and Precision Engineering, 2009, 17(2): 380

    [6] QIAO Naosheng, SUN Ping. Circuitry Detection in Printed Circuit Board[J]. Acta Photonica Sinica, 2013, 42(11): 1355

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Preprocess algorithm of PCB line detection[J]. Optics and Precision Engineering, 2007, 15(2): 272

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    Paper Information

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    Received: Jun. 12, 2006

    Accepted: --

    Published Online: Feb. 18, 2008

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology