Acta Optica Sinica, Volume. 17, Issue 11, 1581(1997)
A Testing System for Two-Dimensional Orthogonal Segmented Wedge Array Applied to Uniform Illumination of Large Focal Spot
A new projection technique for measuring the intensity undulations by interference speckles caused in the micrometer magnitude has successfully been developed, in order to test the focal property of optical array system for uniform illumination. The experimental method, measurement results and error analysis for testing the large scale non uniformity of 1 D and 2 D focal spot and interference speckles of the small scale have been presented.
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[in Chinese], [in Chinese], [in Chinese]. A Testing System for Two-Dimensional Orthogonal Segmented Wedge Array Applied to Uniform Illumination of Large Focal Spot[J]. Acta Optica Sinica, 1997, 17(11): 1581
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