Laser & Optoelectronics Progress, Volume. 51, Issue 11, 110010(2014)

Investigation of III-V on Silicon Adhesively Bonded Semiconductor Lasers with Metal Confinement for Optical Interconnects

Yang Yuede*, Sui Shaoshuai, Tang Mingying, Xiao Jinlong, Du Yun, and Huang Yongzhen
Author Affiliations
  • [in Chinese]
  • show less

    Recently, the III- V on silicon bonded lasers, as a fundamental component of complementary metal oxide semiconductor (CMOS) compatible silicon optical interconnects, have attracted great attention and been extensively studied. The metallic structure can enhance the optical confinement inside the laser resonator, increase the reflectivity at the boundary and give a large fabrication tolerance. Thus a small-volume low-powerconsumption laser can be achieved with the metallic confinement structure. The principle and experimental scheme for the III-V on silicon adhesively bonded semiconductor lasers with metal confinement are introduced, and the lasing characteristics are analyzed. Further development of hybrid laser may lay the foundation for the low-power-consumption high-bandwidth optical interconnects.

    Tools

    Get Citation

    Copy Citation Text

    Yang Yuede, Sui Shaoshuai, Tang Mingying, Xiao Jinlong, Du Yun, Huang Yongzhen. Investigation of III-V on Silicon Adhesively Bonded Semiconductor Lasers with Metal Confinement for Optical Interconnects[J]. Laser & Optoelectronics Progress, 2014, 51(11): 110010

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Reviews

    Received: Apr. 9, 2014

    Accepted: --

    Published Online: Nov. 7, 2014

    The Author Email: Yuede Yang (yyd@semi.ac.cn)

    DOI:10.3788/lop51.110010

    Topics