Acta Photonica Sinica, Volume. 45, Issue 2, 226001(2016)

Analysis and Measurement of Ultrahigh Reflectivity Retroreflection Film of Micro Cutting Cube Corner Prisms

JI Yun1、*, HUANG Meizhen2, LI Xia2, ZOU Ye2, and SONG Biao2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    The reflection property of the micro cutting cube corner prism film with ultrahigh retroreflection is analyzed theoretically by the method of geometrical optics, and verified by optical simulation software. The principle of the ultrahigh retroreflection property was illustrated and compared with the traditional micro cube corner prism film. Results indicate that, parallel light can be totally retroreflected if perpendicularly striking the bottom of the micro cutting cube corner prism unit and ignoring optical absorption of materials, while the retroreflectivity of the traditional micro cube corner prism unit is 66.7%. The simulation retroreflectivity of this two type films are 92.3% and 62.4% respectively. The retroreflection measuring method for film is established and the reflectivities of two type films abovementioned are measured which are 67.8% and 39.5% respectively.

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    JI Yun, HUANG Meizhen, LI Xia, ZOU Ye, SONG Biao. Analysis and Measurement of Ultrahigh Reflectivity Retroreflection Film of Micro Cutting Cube Corner Prisms[J]. Acta Photonica Sinica, 2016, 45(2): 226001

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    Paper Information

    Received: Sep. 22, 2015

    Accepted: --

    Published Online: Apr. 1, 2016

    The Author Email: Yun JI (jiyun9008@163.com)

    DOI:10.3788/gzxb20164502.0226001

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