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Opto-Electronic Engineering, Volume. 31, Issue z1, 124(2004)

Surface analysis using AFM and XPS for LiBq4/ITO and LiBq4/CuPc/IITO

[in Chinese]1, [in Chinese]2, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Surface analysis using AFM and XPS for LiBq4/ITO and LiBq4/CuPc/IITO[J]. Opto-Electronic Engineering, 2004, 31(z1): 124

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    Paper Information

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    Received: May. 17, 2004

    Accepted: --

    Published Online: Nov. 14, 2007

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology