Opto-Electronic Engineering, Volume. 31, Issue 12, 61(2004)
Millimeter-wave image edge detection based on adaptive binarization
Tools
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese]. Millimeter-wave image edge detection based on adaptive binarization[J]. Opto-Electronic Engineering, 2004, 31(12): 61
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20