Acta Optica Sinica, Volume. 40, Issue 18, 1812002(2020)
Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives
A color-camera-based shearography system using dual-wavelength lasers was developed for simultaneously measuring the in-plane and out-of-plane displacement derivatives of a deformed object. Lasers of dual wavelengths are arranged to symmetrically and simultaneously illuminate on the object with identical angles of incidence. A set of phase-shifter and a modified Michelson interferometer are used to build a temporal-phase-shift dual-wavelength shearography. The interferograms formed by the two wavelength are recorded by one 3-chip color camera with green and blue channels. The phases related to the in-plane and out-of-plane components are extracted from the shearograms by using Carré algorithm. Experiment on a cantilevered aluminum beam deformation was performed to verify the feasibility and the capability of the testing system.
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Minyang Wu, Yinhang Ma, Hao Cheng, Fujun Yang. Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives[J]. Acta Optica Sinica, 2020, 40(18): 1812002
Category: Instrumentation, Measurement and Metrology
Received: May. 14, 2020
Accepted: Jun. 9, 2020
Published Online: Aug. 31, 2020
The Author Email: Yang Fujun (yang-fj@seu.edu.cn)