Laser & Optoelectronics Progress, Volume. 52, Issue 10, 100001(2015)

Status and Development of Scanning Beam Interference Lithography System

Cheng Weilin1,2、*, Zhu Jing1,2, Zhang Yunbo1, Zeng Aijun1,2, and Huang Huijie1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less

    Scanning beam interference lithography (SBIL) is advantageous to produce large-area linear diffraction gratings that are phase-accuracy to nanometer level. In order to comprehend the merits of SBIL, the research progress on SBIL both in China and abroad are introduced, and the key technologies in SBIL are summarized from the merits and limitation of the scheme and principle. And then for the application of the specific grating, parameters of the key technologies in SBIL are presented. The development of SBIL is forecasted.

    Tools

    Get Citation

    Copy Citation Text

    Cheng Weilin, Zhu Jing, Zhang Yunbo, Zeng Aijun, Huang Huijie. Status and Development of Scanning Beam Interference Lithography System[J]. Laser & Optoelectronics Progress, 2015, 52(10): 100001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Reviews

    Received: Apr. 9, 2015

    Accepted: --

    Published Online: Oct. 8, 2015

    The Author Email: Weilin Cheng (jiping111@163.com)

    DOI:10.3788/lop52.100001

    Topics