Semiconductor Optoelectronics, Volume. 44, Issue 4, 634(2024)

Buckling Analysis of A Functionally Graded Piezoelectric Semiconductor Extension-Flexure Beam

XU Jiahao... HAN Chaofan and ZHANG Qiaoyun |Show fewer author(s)
Author Affiliations
  • School of Mechanics and Safety Engineering, Zhengzhou University, Zhengzhou 450001, CHN
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    Based on the three-dimensional piezoelectric-semiconductor (PSC) and first-order shear-deformation theories, and considering the coupling extension, flexure, and shear deformations, a buckling model for a one-dimensional functionally graded PSC extension-flexure beam was established. The stability of a functionally graded PSC extension-flexure beam under an axial load was analyzed via the finite element analysis software COMSOL, and the first three critical buckling loads and distributions of the electromechanical field for a simply supported beam were obtained. The influences of the beam length-height ratio, initial electron concentration, and functionally graded parameters on the critical buckling loads are discussed based on some numerical examples.

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    XU Jiahao, HAN Chaofan, ZHANG Qiaoyun. Buckling Analysis of A Functionally Graded Piezoelectric Semiconductor Extension-Flexure Beam[J]. Semiconductor Optoelectronics, 2024, 44(4): 634

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    Paper Information

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    Received: Feb. 17, 2024

    Accepted: Feb. 13, 2025

    Published Online: Feb. 13, 2025

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2024021702

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