Acta Photonica Sinica, Volume. 49, Issue 1, 0112002(2020)

Measurement Technique of High-reflected Surface Based on Phase Measuring Deflectometry

Lian-tao ZHANG... Rong-sheng LU* and Zi-yi CHENG |Show fewer author(s)
Author Affiliations
  • School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, China
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    The direct measurement of the smooth and high-reflected surface was realized using images acquired by a single camera. Firstly, the image of the reference plane in the standard plane mirror was captured by the camera. Then, the depth distance of the mirror to be measured was obtained, by using the dense reflection correspondence between the points on the reference plane and the image points on the normalized imaging plane. Finally, the measurement of high-reflected surface was achieved. The high-reflected surface was measured by finding the "intersection point" between the camera ray beam and the corresponding incident ray beam. The ray tracing was used to transform the measurement process into an intersection problem between the two corresponding ray bundles in the solution space. The normal fields of the surface were obtained and the corresponding reflected light beam was solved based on the surface profile gradient which is obtained by taking the phase information as the carrier. The standard plane mirror is tested and the measured flatness is 0.19 mm. The rearview mirror is detected by the traditional method and the method proposed in this paper, and the average distance between the corresponding points in the test result is 0.15 mm, which verifies the effectiveness of the method for detecting the mirror surface shape.

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    Lian-tao ZHANG, Rong-sheng LU, Zi-yi CHENG. Measurement Technique of High-reflected Surface Based on Phase Measuring Deflectometry[J]. Acta Photonica Sinica, 2020, 49(1): 0112002

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    Paper Information

    Received: Jun. 6, 2019

    Accepted: Aug. 13, 2019

    Published Online: Mar. 19, 2020

    The Author Email: LU Rong-sheng (rslu@hfut.edu.cn)

    DOI:10.3788/gzxb20204901.0112002

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