Laser & Optoelectronics Progress, Volume. 58, Issue 4, 0410016(2021)

Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3

Jiang Chang1, Shengqi Guan1,2、*, Hongyu Shi3, Luping Hu1, and Yiqi Ni1
Author Affiliations
  • 1School of Mechanical and Electronic Engineering, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China
  • 2Shaoxing Keqiao West-Tex Textile Industry Innovative Institute, Shaoxing, Zhejiang 312030, China
  • 3School of Computer Science, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China
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    Aiming at the problem that the small number of samples in the dataset will affect the effect of deep learning detection, a strip defect classification method based on improved generative adversarial networks and MobileNetV3 is proposed in this paper. First, a generative adversarial network is introduced, and the generator and discriminator are improved to solve the problem of category confusion and realize the expansion of the strip defect data set. Then, the lightweight image classification network MobileNetV3 is improved. Finally, it is trained on the expanded data set to realize the classification of strip defects. Experimental results show that the improved generative adversarial network can generate more real strip steel defect images and solve the problem of insufficient samples in deep learning. And the parameter amount of the improved MobileNetV3 is about 1/14 of that before improvement, and the accuracy is 94.67%, which is 2.62 percentage points higher than that before improvement. It can be used for accurate and real-time classification of strip steel defects in industrial field.

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    Jiang Chang, Shengqi Guan, Hongyu Shi, Luping Hu, Yiqi Ni. Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410016

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    Paper Information

    Category: Image Processing

    Received: Jul. 6, 2020

    Accepted: Aug. 6, 2020

    Published Online: Feb. 24, 2021

    The Author Email: Guan Shengqi (sina1300841@163.com)

    DOI:10.3788/LOP202158.0410016

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