Optics and Precision Engineering, Volume. 25, Issue 11, 2829(2017)

Real-time X-ray diffractometry for lattice response measurement under gas-gun loading

TANG Bo1,2、*, HEI Dong-wei2, MA Ge2, SHENG Liang2, ZHOU Hai-sheng2, LIU Xu2, XIA Jing-tao2, LUO Jian-hui2, and WEI Fu-li2
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  • 1[in Chinese]
  • 2[in Chinese]
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    The microscopic response measurement of material dynamics was researched experimentally under the loading conditions of gas gun loading. Based on a flash X-ray source with the half width of 25 ns, a real-time X-ray diffraction diagnostic system was developed by using integral record devices. The measuring principle of X-ray diffraction system was introduced. Due to the duration of shocked state in the probed region and the output timing jitter of the X-ray source, the difficulty of system synchronization for X-ray pulse and shock wave in arriving probe region was discussed. Finally, the method to realize the synchronization of the X-ray pulse with the shock wave was achieved by utilizing a fine multilayered target and a piezoelectric pin with ns response time, and a real time X-ray diffraction image of LiF in the peak compressed state was obtained under gas-gun loading. Experimental results indicate that the lattice compression of LiF is 1.73% when shocked pressure is 2.33 GPa. The experimental technique provides an effective means for research of the microscopic response under a gas-gun loading experiment.

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    TANG Bo, HEI Dong-wei, MA Ge, SHENG Liang, ZHOU Hai-sheng, LIU Xu, XIA Jing-tao, LUO Jian-hui, WEI Fu-li. Real-time X-ray diffractometry for lattice response measurement under gas-gun loading[J]. Optics and Precision Engineering, 2017, 25(11): 2829

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    Paper Information

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    Received: Mar. 31, 2017

    Accepted: --

    Published Online: Jan. 17, 2018

    The Author Email: Bo TANG (tang-b12@mails.tsinghua.edu.cn)

    DOI:10.3788/ope.20172511.2829

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