Semiconductor Optoelectronics, Volume. 43, Issue 2, 395(2022)

Light Field Microscopic Measurement Based on Microlens Array

YANG Fan1...2, YAN Wei2, and LI Fanxing12 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    Compared with the traditional imaging technology, the light field imaging technology can utilize the propagation direction information of the light in the light field, and the computational imaging method can greatly improve the depth of field of the traditional imaging system. The higher the resolution of the traditional optical microscope, the smaller the depth of field. Therefore, in this paper, the light field imaging technology and traditional optical microscope was combined by inserting a microlens array on the primary image plane of the microscope, to improve the depth of field of the microscope, and realize the three-dimensional measurement of light field microscopy. The system can obtain the four-dimensional light field information of the light field through a single exposure, complete the light field microscopic measurement through digital refocusing technology and sharpness evaluation function. The experimental results show that the light field microscopy measurement method based on the microlens array is feasible. The measurement system increases the depth of field of the microscope head by nearly 100 times at the expense of 16 times the lateral resolution.

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    YANG Fan, YAN Wei, LI Fanxing. Light Field Microscopic Measurement Based on Microlens Array[J]. Semiconductor Optoelectronics, 2022, 43(2): 395

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    Paper Information

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    Received: May. 12, 2019

    Accepted: --

    Published Online: Jul. 21, 2022

    The Author Email:

    DOI:10.16818/j.issn1001-5868.2019051200

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