Acta Optica Sinica, Volume. 39, Issue 2, 0212005(2019)

Multi-Fano Resonance Differential Sensing by Single-Baffle Metal-Dielectric-Metal Waveguide Coupled Disk Cavity Cascade

Shuaitao Han1、*, Ying Chen1、*, Yangmei Xu1, Jinggang Cao1, Xinbei Gao1, Jinchao Xie1, and Qiguang Zhu2
Author Affiliations
  • 1 Hebei Province Key Laboratory of Test/Measurement Technology and Instrument, School of Electrical Engineering, Yanshan University, Qinhuangdao, Hebei 0 66004, China
  • 2 Key Laboratory for Special Fiber and Fiber Sensor of Hebei Province, School of Information Science and Engineering, Yanshan University, Qinhuangdao, Hebei 0 66004, China
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    A single-baffle metal-dielectric-metal (MDM) waveguide coupled disk cavity cascade structure is proposed based on the transmission characteristics and photon local characteristics of the surface-plasmon-based sub-wavelength structures. The discrete state provided by the side-coupled disk cavity cascade and is used to provide a continuous state produced by the baffle plate placed in metal-dielectric-metal waveguide interferes constructively or destructively, and thus two different modes of Fano resonance are formed. The transmission characteristics of the formed Fano resonance are analyzed according to the coupled mode theory. The structure is simulated by the finite element analysis method and the effects of the structural parameters on the refractive index sensing characteristics are quantitatively analyzed. The effects of temperature and humidity on the measurement results in the actual measurement process are analyzed, based on the physical mechanism underlying the refractive index change. Moreover, the problem of cross-sensitivity in the sensing process is effectively solved by the differential sensing method.

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    Shuaitao Han, Ying Chen, Yangmei Xu, Jinggang Cao, Xinbei Gao, Jinchao Xie, Qiguang Zhu. Multi-Fano Resonance Differential Sensing by Single-Baffle Metal-Dielectric-Metal Waveguide Coupled Disk Cavity Cascade[J]. Acta Optica Sinica, 2019, 39(2): 0212005

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 12, 2018

    Accepted: Sep. 25, 2018

    Published Online: May. 10, 2019

    The Author Email:

    DOI:10.3788/AOS201939.0212005

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