Laser Journal, Volume. 45, Issue 7, 260(2024)

Intelligent detection method of high voltage insulator defect based on infrared technology

SONG Anfeng1... BAI Yang2, DAI Xinbo1 and ZHANG Zhiwei1 |Show fewer author(s)
Author Affiliations
  • 1Zhengzhou Xianghe Group Co., Ltd., Zhengzhou 450006, China
  • 2Henan University of Technology, Zhengzhou 450001, China
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    In order to improve the intelligence and visualization level of high voltage insulator defect intelligent detection, an intelligent detection method of high voltage insulator defect based on infrared technology is proposed. Infrared visual image detection technology is used to extract the visual characteristics of high voltage insulators during operation. In the image of the high voltage insulator, the pattern, image texture and equipment abnormal state information in the image are analyzed and fused, and the defect detection method is designed. By combining the characteristic quantity of geographic information with the detection system, the defect location of high voltage insulators is realized. At the same time, through the infrared image visual feature point and abnormal feature point calibration technology, the fault, defect and other location information of the high-voltage insulator are calibrated. On the basis of image import and management, defect identification audit, manual labeling and other modules, the intelligent detection of high voltage insulator defect based on infrared technology visual feature recognition is realized. The test results show that the designed intelligent detection method for high voltage insulator defects can accurately calibrate the characteristic quantity of abnormal state information of high voltage insulator, and the root-mean-square error of the detection of defect parts is the lowest 0.061. The reliability and accuracy of the detection of high voltage insulator defects are good.

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    SONG Anfeng, BAI Yang, DAI Xinbo, ZHANG Zhiwei. Intelligent detection method of high voltage insulator defect based on infrared technology[J]. Laser Journal, 2024, 45(7): 260

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    Paper Information

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    Received: Nov. 9, 2023

    Accepted: Dec. 20, 2024

    Published Online: Dec. 20, 2024

    The Author Email:

    DOI:10.14016/j.cnki.jgzz.2024.07.260

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