Chinese Journal of Lasers, Volume. 37, Issue 3, 804(2010)

Testing Method of Laser Equipment Based on Multi-Wavelength Simulated Laser Source Technique

Chen Zhibin*, Xue Mingxi, Hou Zhangya, and Li Yizhao
Author Affiliations
  • [in Chinese]
  • show less

    Using the simulated laser source for optoelectronic instrument testing and calibrating is one of the important methods of optoelectronic equipment fault diagnosis and protection. Under the same platform,for testing laser equipments with different wavelengths,a single wavelength laser source is difficult to meet the requirements of them.In this paper,by using independently developed muliti-wavelengh simulated laser source and the optoelectronic testing platform with the function of optoelectronic testing and controlment,information collection,analysis and processing,a testing method of laser equipments with several different wavelengths is proposed. Experiment shows,the method is appropriate to detect the laser sources with multi-wavelength and different pulse widths,such as 1.06 μm,0.9 μm and 1.55 μm,etc. Due to high integration and small bulk,the operation of testing is convenient in field condition.

    Tools

    Get Citation

    Copy Citation Text

    Chen Zhibin, Xue Mingxi, Hou Zhangya, Li Yizhao. Testing Method of Laser Equipment Based on Multi-Wavelength Simulated Laser Source Technique[J]. Chinese Journal of Lasers, 2010, 37(3): 804

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: measurement and metrology

    Received: Apr. 17, 2009

    Accepted: --

    Published Online: Mar. 11, 2010

    The Author Email: Zhibin Chen (shangxinboy@163.com)

    DOI:10.3788/cjl20103703.0804

    Topics