Acta Photonica Sinica, Volume. 39, Issue 9, 1543(2010)

Optimal Simulation for the Thickness Uniformity of the Film Deposited by Pulse Laser Sputtering

WANG Sheng*, YE Jing-feng, LIU Jing-ru, BAI Ting, YE Xi-sheng, and WANG Li-jun
Author Affiliations
  • [in Chinese]
  • show less

    Method of off-axis rotated scan is studied in order to improve the thickness uniformity of the film by pulse laser deposition (PLD). Based on the principle and spatial distribution of plasma, radial distribution formula of film thickness is formed. Effects on uniformity of film deposited by method of off-axis rotated scan are simulated numerically. The simulated results show that optimize of d (distance between sputtering dot and foundation) and r (interval between particle center and foundation center ) are primary means for improving the uniformity of film. In addition, influence of electromotor rotate speed, working time and laser repetition frequency is considered. Simulated with optimal parameters, maximum radius of film diameter over 40 mm is obtained when 95% uniformity is required.

    Tools

    Get Citation

    Copy Citation Text

    WANG Sheng, YE Jing-feng, LIU Jing-ru, BAI Ting, YE Xi-sheng, WANG Li-jun. Optimal Simulation for the Thickness Uniformity of the Film Deposited by Pulse Laser Sputtering[J]. Acta Photonica Sinica, 2010, 39(9): 1543

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: Oct. 28, 2009

    Accepted: --

    Published Online: Nov. 4, 2010

    The Author Email: Sheng WANG (pplunum1@163.com)

    DOI:

    Topics