Chinese Optics Letters, Volume. 5, Issue s1, 156(2007)

Temperature dependent characteristics of 980 nm two-dimensional bottom emitting VCSEL arrays

[in Chinese]1,2, [in Chinese]1, [in Chinese]1,2, [in Chinese]1,2, [in Chinese]1, [in Chinese]3, [in Chinese]1,2, [in Chinese]1,2, [in Chinese]1,2, [in Chinese]1, and [in Chinese]1
Author Affiliations
  • 1State Key Laboratory of Excited State Processes, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033
  • 2Graduate School of the Chinese Academy of Sciences, Beijing 100039
  • 3Changchun University of Science and Technology, Changchun 130021
  • show less

    High power bottom-emitting In0.2Ga0.8As/GaAs 4*4 two-dimensional vertical-cavity surface-emitting laser (VCSEL) arrays, with high output power in the 980-nm wavelength regime are reported. At room temperature, the 16-element array with 200-micron aperture size of individual elements shows a continuous wave output power of 1.21 W with a lasing wavelength of 981.9 nm. Temperature dependent characteristics of VCSEL arrays with 90-micron aperture size of individual elements are investigated. The lasing wavelength, optical output power and threshold current are measured at various heatsink temperatures. With the increase of heatsink temperature, the maximum output power and slope efficiency are greatly decreased. A red shift of lasing wavelength and a widening of the lasing spectrum are also observed.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Temperature dependent characteristics of 980 nm two-dimensional bottom emitting VCSEL arrays[J]. Chinese Optics Letters, 2007, 5(s1): 156

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: Jan. 1, 1949

    Accepted: --

    Published Online: Jul. 15, 2007

    The Author Email:

    DOI:

    Topics