Chinese Journal of Quantum Electronics, Volume. 25, Issue 4, 471(2008)
Influence of electronic correlation on FWM and XPM in Si-EDFAs and Te-EDFAs
Analyses show that the linewidth of emission spectra of EDFA determines the 4f shell electronic correlation. It influences the electronic dipole-dipole interaction and the resonantly enhanced nonlinearity of erbium ions. Si-EDFAs and Te-EDFAs,with different emission linewidths,correspond to different level of resonantly enhanced nonlinearities. Comparison of crosstalk induced by four-wave mixing and cross-phase modulation in Si-EDFAs and Te-EDFAs is carried out using semiclassical theory. The results show that Te-EDFA corresponds to much smaller crosstalk than Si-EDFA,and therefore is more appropriate for DWDM communications.
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XUE Yan-ling. Influence of electronic correlation on FWM and XPM in Si-EDFAs and Te-EDFAs[J]. Chinese Journal of Quantum Electronics, 2008, 25(4): 471
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Received: Sep. 28, 2007
Accepted: --
Published Online: Jun. 7, 2010
The Author Email: Yan-ling XUE (ylxue@ee.ecnu.edu.cn)
CSTR:32186.14.