Quantitative measurements of reflected optical second harmonic generation (SHG) of 1.06 μm versus the angle of polarization of the incident light from the interface between opaque silver films and several glasses are presented. And we also measured the reflected SHG from the surface of vacuum cold-evaporated thick silver film on a polyorystalline silver substrate in ultra-high vacuum (UHV) chamber before and after annealing the specimen. For comparison, the reflected SHG from 99.99% finely polished polycrystalline silver surface was detected in UHV. We measured that the phenomenological parallel current parameter b is equal to -0.97 and the phenomenological normal current parameter a had a value of 2.1 for glass-silver interface and -9 for polyclystalline silver sample. And that a varied from 7 to -5 for the cold-evaporated silver film on a polycrystalline silver substrate with the sample annealed. The experimental result shows that the parameter a is sensitive to the surface of the silver film.