Acta Optica Sinica, Volume. 21, Issue 8, 918(2001)

Atom-Lithography in Red Far-Detuning High-Power Standing Wave

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less

    The focusing properties of a red far detuning high power standing wave for a thermal atomic beam are studied through numerical simulation. The result shows that this type of standing wave is possible to be used for atom lithography. The FWHM of the line width deposited on the substrate at the focal plane of the thermal atomic beam is about 20 nm, the contrast is 4~5, with beam waist w 0=0.1 mm, power P=7 W respectively. A proposal of using enhanced cavity to increase the line contrast to 7 and decrease the FWHM of the line width to 5 nm~10 nm is put forward.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Atom-Lithography in Red Far-Detuning High-Power Standing Wave[J]. Acta Optica Sinica, 2001, 21(8): 918

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Rapid communications

    Received: Apr. 10, 2000

    Accepted: --

    Published Online: Aug. 10, 2006

    The Author Email:

    DOI:

    Topics