Laser & Optoelectronics Progress, Volume. 60, Issue 7, 0712005(2023)

Research on Imaging Quality Comprehensive Evaluation by Multi-Parameters of Line Structured Light Stripe

Taotao Li1、*, Pei Shen1, Xiaoqian Zhong1, Xianlei Xu2, and Jiangying Liu1
Author Affiliations
  • 1School of Electromechanical Engineering, Pingxiang University, Pingxiang 337055, Jiangxi, China
  • 2State Key Laboratory of Coal Resources and Safe Mining, China University of Mining and Technology (Beijing), Beijing 100083, China
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    The imaging quality of light stripe is one of the important factors determining the 3D measurement accuracy of line structured light. In order to solve the problems of poor consideration of the image's whole and details and lack of comprehensive evaluation criteria in the present imaging quality evaluation methods of light stripe, an imaging quality comprehensive evaluation method by multi-parameters of line structured light stripe is proposed. First, the characteristics of light stripe image set acquired with a gradual change in exposure time are analyzed from three aspects: one-dimensional image entropy, local contrast, and light stripe's definition. Then the imaging quality of light stripe images are reversely evaluated by the extraction accuracy of the image set's light stripe centers, and the change rule of multi-feature parameters with the light stripe center extraction accuracy is analyzed. Finally, the imaging quality is comprehensively evaluated by multi-feature parameters of line structured light stripe image set, and the multi-parameter comprehensive quantitative evaluation model is constructed. The experimental results show those the evaluation result of the proposed method is more accurate and effective than those of the existing methods, and the high-precision rack measurement results obtained from the evaluated high-quality light stripe images have the highest accuracy, whose Rssa value is only 0.022.

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    Taotao Li, Pei Shen, Xiaoqian Zhong, Xianlei Xu, Jiangying Liu. Research on Imaging Quality Comprehensive Evaluation by Multi-Parameters of Line Structured Light Stripe[J]. Laser & Optoelectronics Progress, 2023, 60(7): 0712005

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 28, 2022

    Accepted: Mar. 30, 2022

    Published Online: May. 24, 2023

    The Author Email: Li Taotao (ltaotao1988@126.com)

    DOI:10.3788/LOP220829

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