Acta Optica Sinica, Volume. 6, Issue 10, 954(1986)
A comprehensive investigation on characteristics of typical periodic film systems consisting of two thin-film materials
A comprehensive investigation of the characteristics of two kinds of periodic film system (pq)m and (aba)m consisting of two layers with difference thicknesses is presented in this paper. The location of high reflectance zones, the periodicity and symmetry of reflectance curves, and the width and height of high reflectance zones are discussed. In addition, a graphical approach to determine the width of reflectance zones is suggested.
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HE ZHAOLiN, ChEn huiguang. A comprehensive investigation on characteristics of typical periodic film systems consisting of two thin-film materials[J]. Acta Optica Sinica, 1986, 6(10): 954