Spectroscopy and Spectral Analysis, Volume. 35, Issue 4, 1089(2015)

Study on the Interface Characteristics of Cemented Carbide after Stripping Ti Department Coatings

YAN Qiang1,2、*, LIANG Zheng1, SONG Hui-jin3, WU Tao2, and WU Jun2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    TiAlN Coatings were stripped by chemical method,which were deposited on YW2 Alloy by arc ion plating.The surface morphology and composition of the cemented carbide after stripping TiAlN coatings by chemistry method were analyzed.It was found that TiAlN coatings on the cemented carbide substrates could be removed by being taken in 30% of hydrogen peroxide and potassium oxalate in alkaline mixed solution(VNaOH solution:V30%H2O2:VCOOK solution=1:1:1)at 45 ℃ for 45 minutes.The surface of the cemented carbide substrate was bright,and the color was the same as that before depositing TiAlN coatings.The surface of the substrate after removing was studied by X-ray photoelectron spectrum (XPS).The results showed that binding energies of the W element and the main peak of N element on the substrate surface were much close to the criterion binding energy in the XPS data-base;and the valence of the element on the YW2 alloy changed little.The Al,Ti and N elements diffusing into the superficial zone of the sample during the coating depositing process made their contents increase and the band energy location offset after stripping the coating.TiN and AlN were formed,which benefit to increase the film-substrate cohesion during re-preparing coatings.The influence of stripping solution on the corrosion degree of cemented carbide substrate was small.

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    YAN Qiang, LIANG Zheng, SONG Hui-jin, WU Tao, WU Jun. Study on the Interface Characteristics of Cemented Carbide after Stripping Ti Department Coatings[J]. Spectroscopy and Spectral Analysis, 2015, 35(4): 1089

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    Paper Information

    Received: Aug. 21, 2014

    Accepted: --

    Published Online: Apr. 20, 2015

    The Author Email: Qiang YAN (yhd1210@163.com)

    DOI:10.3964/j.issn.1000-0593(2015)04-1089-05

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