During the development of a charge-coupled device （CCD） imaging circuit， it is necessary to adjust the parameters of the CCD’s driving signal and repeatedly test the full-well parameters dozens or even hundreds of times to ensure the optimal full-well performance of the CCD. To achieve this， the general method employed， known as the photon transfer curve method， requires integrating a sphere and other equipment to create a flat-field light source system. However， the resulting system is complex， and hence， it is unsuitable for application in a full-well testing method during the development of an imaging system. In this paper， a novel full-well testing method， a light-emitting diode （LED） point test method， is proposed. Accordingly， CCD full-well testing can be easily realized by developing an LED point light source and common civilian lens. The results reveal that the number of full-well electrons of a spaceborne CCD can reach 817.013ke^-， and the error can be less than 0.643%. The results also indicate that the errors resulting from the LED point test method and the traditional method are， respectively， 0.0397% and 1.9% compared with the errors resulting from the photon transfer curve method. In summary， the LED point test method can be used as a general method to rapidly measure the full-well parameters of a CCD under simple conditions， and it can enhance the efficiency of CCD imaging circuit development.