In order to obtain the relationship between the white light interference color and the physical quantities of a sample such as the thickness, the standard computer representation of an interference color on a given optical path difference is studied. Based on the CIE1931XYZ color space, we use the known spectral power distribution of standard illuminant to calculate XYZ values of each point in Michelson interference field. The problem of the negative RGB values which convert from XYZ values is solated to realize the continuity of color display. The simulated white light equal-thickness and equal-inclination interferograms of an ideal wavefront are demonstrated. A real interference wavefront and a real lamp are used to obtain simulated white light interferograms. This method makes it easy to obtain the interference color distribution of an interference field on the condition that the spectral power distribution is known. It provides the basis for glass stress measurement, film thickness measurement, and other related field.