Acta Optica Sinica, Volume. 25, Issue 1, 121(2005)

Measurement of Electrooptic Coefficients in SBN60 Thin Films and Their Applications in Mach-Zehnder Type Waveguide Modulators

[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    High-quality c-axis oriented SBN60 thin films on MgO(001) substrates have been obtained by the sol-gel process, the transverse electrooptic coefficients r51 of the SBN60 without K-doped and K-doped (with the K+/Nb5+ molar ratio of 1/3) SBN60 thin films were measured as 37.6 pm/V and 58.5 pm/V respectively. The transverse coefficient of the SBN60 films was shown to increase with the K ions doping. Mach-Zehnder type waveguide modulators made of SBN60 thin films were designed. Electrooptic modulation has been demonstrated with the half-wave modulation voltage Vπ=16 V for SBN60 and that of Vπ=10 V for the K-doped SBN60 at 633 nm wavelength. The half-wave modulation voltage was demonstrated to be decreased with the K ion doping.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of Electrooptic Coefficients in SBN60 Thin Films and Their Applications in Mach-Zehnder Type Waveguide Modulators[J]. Acta Optica Sinica, 2005, 25(1): 121

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    Paper Information

    Category: Thin Films

    Received: Dec. 11, 2003

    Accepted: --

    Published Online: May. 22, 2006

    The Author Email: (shenzhiru@sohu.com)

    DOI:

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