Chinese Journal of Quantum Electronics, Volume. 21, Issue 4, 542(2004)
Tests and analyses of multilayer structure HB-LED epitaxial slice by electrochemical C-V measurement
Electric parameters of double heterojunction multilayer structure epitaxy slice (depth, dope concentration, electric type etc.) were tested and analysed by ECV. Epitaxial slice parameters were measured.
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[in Chinese], [in Chinese], [in Chinese]. Tests and analyses of multilayer structure HB-LED epitaxial slice by electrochemical C-V measurement[J]. Chinese Journal of Quantum Electronics, 2004, 21(4): 542
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