Infrared Technology, Volume. 44, Issue 6, 565(2022)

Infrared Image Defect Information Extraction Based on Temporal Information

Dongsheng WANG1、*, Hailong WANG1,2, Fang ZHANG1,3, Linfang HAN1,3, and Yilin ZHAO1,3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less

    In active infrared thermography technology, the extraction of defect information from infrared images is crucial. Traditional image processing methods can eliminate noise and improve image contrast, but several challenges remain, such as selecting the infrared image manually, subjectivity in the process of infrared image enhancement and segmentation, and information loss in the process of a single infrared image. To overcome these challenges, this study proposes a method for extracting defect information from infrared images based on time sequence information. First, concrete blocks with delamination are fabricated by indoor experiments. Then, active infrared thermal image detection technology is used to collect the infrared image data and temporal information is extracted for each pixel. Finally, the K-means method is used for defect feature extraction based on temporal information. The results show that the defect extraction method based on temporal information can extract hidden defect information. Furthermore, its hierarchical defect information extraction effect is better than that of the K-means method based on the spatial domain.

    Tools

    Get Citation

    Copy Citation Text

    WANG Dongsheng, WANG Hailong, ZHANG Fang, HAN Linfang, ZHAO Yilin. Infrared Image Defect Information Extraction Based on Temporal Information[J]. Infrared Technology, 2022, 44(6): 565

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Jul. 12, 2021

    Accepted: --

    Published Online: Jul. 25, 2022

    The Author Email: Dongsheng WANG (wds0301@outlook.com)

    DOI:

    Topics