Laser & Optoelectronics Progress, Volume. 50, Issue 9, 91203(2013)
Research on Variable Step-Size Sampling in the Defect Detection of Product Surface
In order to achieve the detection of the structural quality for complicated products accurately and rapidly, we adopt variable step-size sampling mechanism to quickly obtain the circumferential range image sequence for the product that has a variety of structural and spatial dimensional areas to be tested on the surface. With such an image sequence, rapid detection of multiple areas to be identified can be realized in the limited orientation by using incomplete data. Firstly, projection method is used to determine the rotational step and a minimum step size is selected as the qualified product sampling step in order to ensure the integrity of the information in the standard library. Secondly, the scale invariant feature transform (SIFT) algorithm and binary search are selected to find the optimal location information of product in the standard image library. Finally, the correlation degree is calculated to discriminate defects in some areas. The experimental result shows that the variable step-size method can save an average detection time of 4.14 s in comparison with the traditional fixed-step detection in the premise of ensuring the accuracy of detection.
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Xu Qing, Han Yueping, Yang Zhigang. Research on Variable Step-Size Sampling in the Defect Detection of Product Surface[J]. Laser & Optoelectronics Progress, 2013, 50(9): 91203
Category: Instrumentation, Measurement and Metrology
Received: Apr. 14, 2013
Accepted: --
Published Online: Aug. 21, 2013
The Author Email: Qing Xu (sizhuqingsci@163.com)