Improving the technical performance of the industrial computed tomography （CT） testing system has always been the common objective of the system’s R&D personnel and users in the field of radiographic nondestructive detection. To this end， a CT image detection method using a scintillation screen coupled with a scientific level-filter array complementary metal–oxide–semiconductor （CMOS） camera is proposed. The important engineering details associated with the hardware and software development of the micro focus industrial CT system using this method are introduced. The comparison results of the measured technical parameters of the independently developed anti-radiation X-ray digital camera and those of the commercial flat panel detector are presented. In addition， the comparison results of the computed efficiency of the CT reconstruction algorithm of the X-ray CT integrated software （CTER MAX） and that of an equivalent commercial software， as well as the detection results of the CT system spatial resolution are described. The results indicate that the anti-radiation X-ray digital camera has advantages including ultra-high pixel sampling， low noise， high dynamic range， high resolution， radiation resistance， and low cost. In terms of spatial resolution， it has more scope for improvement than the flat panel detector and is more adaptable to meeting the needs of more application scenarios. The CTER MAX software has complete functionality and is user-friendly. Compared with the commercial software， it has approximately 4.5 times faster computing rate. The comprehensive spatial resolution of the CT system is 5 μm， which is equivalent to the focal spot size of the radiation source. The system is stable and reliable， and it can be extensively used in various industrial nondestructive detection fields， such as the detection of defects in aircraft engine leaves （or blades） and rocks.