Chinese Optics Letters, Volume. 3, Issue 0s, 318(2005)

Temporal characteristic simulation for stimulated emission depletion microscopy

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
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    The imaging technology of stimulated emission depletion (STED) utilizes the nonlinearity relationship between the fluorescence saturation and the excited state stimulated depletion. It implements three-dimensional (3D) imaging and breaks the diffraction barrier of far-field light microscopy by restricting fluorescent molecules at a sub-diffraction spot. In order to improve the resolution which attained by this technology, the computer simulation on temporal behavior of population probabilities of the sample was made in this paper, and the optimized parameters such as intensity, duration and delay time of the STED pulse were given.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Temporal characteristic simulation for stimulated emission depletion microscopy[J]. Chinese Optics Letters, 2005, 3(0s): 318

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    Received: --

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    Published Online: Mar. 5, 2007

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