Journal of Inorganic Materials, Volume. 38, Issue 10, 1207(2023)
The SiO2-BaO-based glass-ceramics have become the focus of research in the field of high sealing resistance due to their high expansion coefficient and excellent high resistance, but the effect of rare earth oxide on modification of this kind of sealing glass-ceramics is rarely reported. Here, the effects of rare earth elements with different cation field strength (CFS) replacing traditional alkaline-earth oxide BaO on the network structure, crystallization properties, microstructures, and high-temperature resistivity of a new type of rare-earth rich-SiO2-BaO-Ln2O3 (SBLn, Ln=La, Sm, Er, Yb) series glass were studied. With the increase of rare earth cation field from 2.82 in La3+ to 3.98 in Yb3+, the glass transition temperature (Tg), crystallization initiation temperature (Tx) and crystallization peak temperature (Tp) of SBLn glass are increased, implying that the SBLn glass with higher rare earth cation field strength is more stable. Crystalline phases of the four SBLn glasses are composed of BaSiO3 and BaSi2O5 phases. When rare-earth cation field strength increases, the BaSiO3 phase decreases while the BaSi2O5 phase increases. Rare-earth elements only exist in the glass phase and do not participate the crystal phase precipitation. The crystallization amount decreases with the increase of rare earth cation field, coefficient of thermal expansion (CTE) of SBLn glass-ceramic increases from 12.52×10-6 /℃ to 13.13×10-6 /℃ (30-800 ℃), but softening temperature decreases from 1313.5 ℃ to 1174.1 ℃. In short, the CTE, softening temperature and DC resistivity at 700 ℃ of the SiO2-BaO-Ln2O3 glass-ceramics are greater than 12×10-6/℃, 1150 ℃ and 106 Ω·cm, respectively, indicating that the rare-earth-rich glass-ceramic sealant has a promising application prospect in the field of high sealing resistance, such as solid oxide fuel cell, oxygen sensors, platinum thin-film thermistor under elevated temperature.
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Yanguo YANG, Haishen REN, Daihua HE, Huixing LIN.
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Received: Jan. 29, 2023
Accepted: --
Published Online: Mar. 6, 2024
The Author Email: REN Haishen (renhaishen@mail.sic.ac.cn), LIN Huixing (huixinglin@mail.sic.ac.cn)