Laser & Optoelectronics Progress, Volume. 61, Issue 1, 0112003(2024)

Ultrafast Microwave Photonics Frequency Measurement Technology (Invited)

Henan Wang1、*, Liang Chen1, Yongguang Qi1, Dexin Ba2,3, and Yongkang Dong2,3、**
Author Affiliations
  • 1Beijing Institute of Control and Electronic Technology, Beijing 102300, China
  • 2State Key Laboratory of Tunable Laser Technology, Harbin Institute of Technology, Harbin 150001, Heilongjiang, China
  • 3Zhengzhou Research Institute, Harbin Institute of Technology, Zhengzhou 450000, Henan, China
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    Microwave photonics frequency measurement technology uses optical structure and technology to generate, manipulate, transmit and measure high-speed microwave, and combines the advantages of high bandwidth, high reuse and low loss of photonics with the advantages of high precision, flexibility and easy regulation of microwave technology, which can greatly improve the performance of existing dynamic spectrum monitoring systems. It has significant advantages and application prospects in electronic countermeasures, radar, high-speed communication and other fields. In this paper, the research progress of microwave photonics frequency measurement technology is summarized, and the key indicators of frequency measurement speed and precision of three kinds of microwave photonics frequency measurement technology, including spectrum analysis, power mapping and channel type, are compared. Finally, the research work of microwave photon frequency measurement technology based on optical chirped chain transient stimulated Brillouin scattering effect is discussed.

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    Henan Wang, Liang Chen, Yongguang Qi, Dexin Ba, Yongkang Dong. Ultrafast Microwave Photonics Frequency Measurement Technology (Invited)[J]. Laser & Optoelectronics Progress, 2024, 61(1): 0112003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 8, 2023

    Accepted: Dec. 27, 2023

    Published Online: Feb. 6, 2024

    The Author Email: Wang Henan (wanghenan1994@126.com), Dong Yongkang (aldendong@163.com)

    DOI:10.3788/LOP232641

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