Laser & Optoelectronics Progress, Volume. 60, Issue 7, 0716001(2023)

Simulation Study on Behavior Characteristics of Ion-Beam Sputtering to Fused Silica, Silicon, Gold, and Copper Using Monte Carlo Method

Bangjie Hu1, Qinghua Zhang2, Mincai Liu2, Qiao Xu2, and Yaguo Li1、*
Author Affiliations
  • 1Fine Optical Engineering Research Center, Chengdu 610041, Sichuan, China
  • 2Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, Sichuan, China
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    In this study, the Monte Carlo method is used to examine the effects on the sputtering characteristic parameters of sputtering yields, damage density distributions, and longitudinal energy damage distributions with different sputtering parameters and material models. Based on the particle tracking and physical statistical results of SRIM-2013 software, the effects of the initial energy of the ion beam, incident angle, ion type, and material type on surface sputtering and energy deposition are analyzed, and the relationship among surface damage distribution, sputtering parameters, and sputtering yield are studied. The results show that a beam-source inclination of 85° can promote the density concentration and peak density group of cascading particles to a surface of 2.8×108 atom/cm2 and 3×10-10 m, respectively, thereby reducing the average energy loss by 45.6% and increasing the Ar+ sputtering yield by a factor of 4.7. The substantial energy loss caused by phonons and ionization inhibits the increase in sputtering yield, and the two energy losses account for 69% and 30% of the total loss, respectively, at an incidence angle of 0°.

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    Bangjie Hu, Qinghua Zhang, Mincai Liu, Qiao Xu, Yaguo Li. Simulation Study on Behavior Characteristics of Ion-Beam Sputtering to Fused Silica, Silicon, Gold, and Copper Using Monte Carlo Method[J]. Laser & Optoelectronics Progress, 2023, 60(7): 0716001

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    Paper Information

    Category: Materials

    Received: Nov. 4, 2021

    Accepted: Feb. 18, 2022

    Published Online: Mar. 31, 2023

    The Author Email: Li Yaguo (yargolee@163.com)

    DOI:10.3788/LOP212871

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