Laser & Optoelectronics Progress, Volume. 58, Issue 11, 1112008(2021)

A Random Two-Step Phase Shift Algorithm Based on Polynomial Fitting Background Light

Jing Li1, Ailing Tian1、*, Dasen Wang2, Bingcai Liu1, Xueliang Zhu1, and Hongjun Wang1
Author Affiliations
  • 1Shaanxi Province Key Laboratory of Membrane Technology and Optical Test, School of Optoelectronic Engineering, Xi′an Technology University, Xi′an, Shaanxi 710021, China
  • 2Inner Mongolia Metal Material Research Institute, Ningbo , Zhejiang 315103, China
  • show less

    The precision of phase extraction directly affects that of interferometry. The traditional fixed-step or equal-step length phase extraction algorithm must carry out phase calibration for the test system, but phase shift error is often introduced due to inaccurate phase calibration, which affects the precision of phase extraction. Therefore, this paper proposes a random two-step phase shift algorithm of K-order two-dimensional polynomial fitting background light (PFBL) to solve phase. This algorithm does not need to carry out phase calibration, and can solve the measured phase with only two frames of phase-shift interferogram when phase shift quantity, background light, modulation system and phase are unknown. When order number K value is greater than or equal to 2, it is determined by the simulation of K-order two-dimensional polynomial, the accuracy of the proposed algorithm for phase can be higher. At the same time, the algorithm robustness is analyzed by comparing the calculation accuracy of Gram-Schmidt orthogonalization (GS) two step phase-shift algorithm with the PFBL method. The results show that the PFBL method has good robustness in the interferogram phase shift, non-uniform illumination and noise, and the calculation accuracy of the PFBL method is obviously better than that of GS algorithm.

    Tools

    Get Citation

    Copy Citation Text

    Jing Li, Ailing Tian, Dasen Wang, Bingcai Liu, Xueliang Zhu, Hongjun Wang. A Random Two-Step Phase Shift Algorithm Based on Polynomial Fitting Background Light[J]. Laser & Optoelectronics Progress, 2021, 58(11): 1112008

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 5, 2020

    Accepted: Dec. 14, 2020

    Published Online: Jun. 7, 2021

    The Author Email: Tian Ailing (ailintian@xatu.edu.cn)

    DOI:10.3788/LOP202158.1112008

    Topics