Acta Optica Sinica, Volume. 20, Issue 9, 1208(2000)
An Approximate Method for Calculating Thickness of Metal Multilayer Interface
The metal multilayers were sputtering deposited on K9 glass,and their simple structural parameters were obtained by the small angle X-ray diffraction.A formula for calculating the thickness of transfer layers is proposed,and the calculated results of samples is presented.Compared to the results obtained from the fitting method,these results are similar.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Approximate Method for Calculating Thickness of Metal Multilayer Interface[J]. Acta Optica Sinica, 2000, 20(9): 1208
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