INFRARED, Volume. 46, Issue 2, 26(2025)

QT-Based Characteristic Parameter Testing Method for Infrared Detectors

Bo-wen LIU... Chen QIU, Xiao-long WANG, Yan-lei XING, Liang WANG and Yan-guan CHEN |Show fewer author(s)
Author Affiliations
  • North China Research Institute of Electro-Optics, Beijing 100015, China
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    Affected by the widespread application of infrared detectors, the demand for performance data analysis of infrared detectors is diverse and complex. For some characteristic parameters that cannot be directly measured or are difficult to obtain (such as dark current, quantum efficiency, etc.), a QT-based integrated test method for infrared detector characteristic parameters is proposed, including traditional test systems and self-developed calculation software. The calculation software is developed using QT and C++ language. The underlying algorithm design and development is completed independently, so that it has the calculation function of various characteristic parameters such as the number of blackbody radiation photons, dark current, quantum efficiency, etc. at any temperature in the full band. The existing calculation software only supports a single performance parameter calculation function, and there are problems such as poor universality and low fault tolerance in the parameter calculation process. The proposed software adopts packet processing for the underlying calculation principle and integrates multiple performance parameter calculation functions. After verification by infrared detectors of various array sizes, the software has the advantages of accuracy and convenience.

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    LIU Bo-wen, QIU Chen, WANG Xiao-long, XING Yan-lei, WANG Liang, CHEN Yan-guan. QT-Based Characteristic Parameter Testing Method for Infrared Detectors[J]. INFRARED, 2025, 46(2): 26

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    Paper Information

    Received: Jun. 15, 2024

    Accepted: Mar. 13, 2025

    Published Online: Mar. 13, 2025

    The Author Email:

    DOI:10.3969/j.issn.1672-8785.2025.02.004

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