Spectroscopy and Spectral Analysis, Volume. 33, Issue 3, 829(2013)
Investigation of Characteristic Microstructures of Adhesive Interface in Wood/Bamboo Composite Material by Synchrotron Radiation X-Ray Phase Contrast Microscopy
Third-generation synchrotron radiation X-ray phase-contrast microscopy(XPCM)can be used for obtaining image with edge enhancement, and achieve the high contrast imaging of low-Z materials with the spatial coherence peculiarity of X-rays. In the present paper, the characteristic microstructures of adhesive at the interface and their penetration in wood/bamboo composite material were investigated systematically by XPCM at Shanghai Synchrotron Radiation Facility (SSRF). And the effect of several processing techniques was analyzed for the adhesive penetration in wood/bamboo materials. The results show that the synchrotron radiation XPCM is expected to be one of the important precision detection methods for wood-based panels.
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PENG Guan-yun, WANG Yu-rong, REN Hai-qing, YANG Shu-min, MA Hong-xia, XIE Hong-lan, DENG Biao1, DU Guo-hao1, XIAO Ti-qiao. Investigation of Characteristic Microstructures of Adhesive Interface in Wood/Bamboo Composite Material by Synchrotron Radiation X-Ray Phase Contrast Microscopy[J]. Spectroscopy and Spectral Analysis, 2013, 33(3): 829
Received: Jun. 25, 2012
Accepted: --
Published Online: Mar. 27, 2013
The Author Email: Guan-yun PENG (pengguanyun@sinap.ac.cn)