Opto-Electronic Engineering, Volume. 33, Issue 10, 5(2006)
Opto-electronic theodolite multiple ballistic test based on fuzzy c-means clustering
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Opto-electronic theodolite multiple ballistic test based on fuzzy c-means clustering[J]. Opto-Electronic Engineering, 2006, 33(10): 5
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