A test system was established to test the photoelectric characteristic parameters of thin film and module solar cells rapidly and accurately, and the control mode and test accuracy of the test system were studied. By taking the DSP chip TMS320LF2407 as the main chip, the modular and bus structures as the design idea, the obtained system show a faster response and a good scalability. With the applications of high precision operational amplifiers and other electronic components, a program-controlled electronic load was developed,so that the short-circuit currents and open-circuit voltages of the solar cells can be measured accurately. Furthermore,the multi-channel electronic switches, relays and precision resistors were combined to realize an adaptive test,and the photoelectric characteristic parameters of different thin film and module solar cells were measured accurately. The experiment results show that the test system can complete the adaptive test while the short-circuit current is in the range of 3 mA to 5.6 A and the open-circuit voltage is from 0 V to 50 V. The relative error is less than 0.6% for the measurement of open-circuit voltage and 0.8% for the measurement of short-circuit current,respectively. This result satisfies the demands of solar cell test.