Laser & Optoelectronics Progress, Volume. 51, Issue 11, 111202(2014)
Spectral Response Testing and Uncertainty Evaluation of Plane Array CCD
Based on the method of monochromator, the spectral response of plane array CCD is tested and the uncertainty of the results is evaluated in all respects. The principle of the test method is introduced, a set of spectral testing device which uses the silicon trap as the standard detector is designed. Within the range of 400~1000 nm, the spectral characteristics of the plane array CCD is obtained, including the peak wavelength of 602 nm, the center wavelength of 580 nm and the spectral band wavelength of 402 nm. According to the spectral response at 632 nm, an uncertainty evaluation model is established to analyze all the factors that have impact on the test results, including the irradiance responsivity non- uniformity of plane array CCD, the stability of bromine tungsten lamp, the repeatability and accuracy of emitting wavelength of monochromator, as well as the stability of the image acquisition and processing system. According to the model, the combined standard uncertainty is 4.3% (k=1), which can meet the requirement of spectral response testing accuracy of plane array CCD.
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Li Xiaojie, Ren Jianwei, Liu Hongxing, Wan Zhi. Spectral Response Testing and Uncertainty Evaluation of Plane Array CCD[J]. Laser & Optoelectronics Progress, 2014, 51(11): 111202
Category: Instrumentation, Measurement and Metrology
Received: Jun. 3, 2014
Accepted: --
Published Online: Nov. 7, 2014
The Author Email: Xiaojie Li (xiaojieli2009@126.com)