Laser & Optoelectronics Progress, Volume. 52, Issue 8, 81201(2015)
Measurement of Piezoelectric Device Response by Optical Interferometry
The displacement-voltage characteristics of a pre-load structure piezoelectric ceramic is measured by using optical interferometry.The influence of the resonance of piezoelectric device and its supporting structure on the accuracy of the measurement is observed.Furthermore,the comparative experiments are set up to study a variety of piezoelectric devices under several driving frequencies.It is proved that multiple-time measurement based on traditional device is necessary to get a more rigorous result of the piezoelectric response parameters.
Get Citation
Copy Citation Text
Yang Bin, Zhao Qi, Zhou Jun, Chen Yanru, Wu Jiabin, Song Weier. Measurement of Piezoelectric Device Response by Optical Interferometry[J]. Laser & Optoelectronics Progress, 2015, 52(8): 81201
Category: Instrumentation, Measurement and Metrology
Received: Apr. 3, 2015
Accepted: --
Published Online: Jul. 29, 2015
The Author Email: Bin Yang (ybin319@163.com)