Acta Optica Sinica, Volume. 17, Issue 1, 102(1997)
Optical Recording Performance of GeSb2Te4Phase Change Thin Film Material Using Short Wavelength (514.5 nm) Laser
The optical properties of monolayer GeSb 2Te 4 thin film prepared by vacuum RF sputtering method at the region 400~830 nm were studied. A comparatively large absorption was observed in the wavelength range of 400~600 nm. The optical storage characteristics of GeSb 2Te 4 thin film indicated that larger reflectivity contrast can be obtained at lower writing power Argon laser (514.5 nm) . The erasing reflectivity contrast is low, but it can be improved by multi layer films match.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Optical Recording Performance of GeSb2Te4Phase Change Thin Film Material Using Short Wavelength (514.5 nm) Laser[J]. Acta Optica Sinica, 1997, 17(1): 102