Chinese Journal of Lasers, Volume. 37, Issue 3, 822(2010)
Effects of Thermal Annealing on the Properties of GaN Metal-Semiconductor-Metal UV Photodetectors
Metal-semiconductor-metal structured GaN ultraviolet photodetectors are fabricated on sapphire substrates by metalorganic chemical vapor deposition. The properties of GaN photodetectors are improved through thermal annealing. With a 3 V bias,the very low dark current is about 200 pA,the maximum responsivity of 0.19 A/W is achieved at 362 nm,and the corresponding detectivity is 1.2×1011cm·Hz1/2/W. The physical mechanism about the effects of thermal annealing is studied,which is attributed to the introducing Au by the thermal annealing.
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Zhao Man, Zhao Mei, Fan Xiuying, Zhou Maiyu, Gu Feng, Zhang Yong, Bao Jinhe. Effects of Thermal Annealing on the Properties of GaN Metal-Semiconductor-Metal UV Photodetectors[J]. Chinese Journal of Lasers, 2010, 37(3): 822
Category: measurement and metrology
Received: Apr. 24, 2009
Accepted: --
Published Online: Mar. 11, 2010
The Author Email: Man Zhao (zhaoman1982@126.com)