Chinese Optics Letters, Volume. 6, Issue 9, 673(2008)

Method for rapid measuring retardation of a quarter-wave plate based on simultaneous phase shifting technique

Kun Yang1,2、*, Aijun Zeng3, Xiangzhao Wang1, Feng Tang1, and Hua Wang1,2
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049
  • 3Shanghai Hengyi Optics and Fine Mechanics Co., Ltd, Shanghai 201800
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    A method for rapid measuring retardation of a quarter-wave plate based on simultaneous phase shifting technique is presented. The simultaneous phase shifting function is realized by an orthogonal grating, a diaphragm, an analyzer array, and a 4-quadrant detector. The intensities of the light beams from the four analyzers with different azimuths are measured simultaneously. The retardation of the quarter-wave plate is obtained through the four light intensity values. In this method, the major axis position of the quarter-wave plate need not be determined in advance. In addition, the measured result is free of the intensity fluctuation of light source. The feasibility of the method is verified by the experiments.

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    Kun Yang, Aijun Zeng, Xiangzhao Wang, Feng Tang, Hua Wang. Method for rapid measuring retardation of a quarter-wave plate based on simultaneous phase shifting technique[J]. Chinese Optics Letters, 2008, 6(9): 673

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    Paper Information

    Received: Mar. 21, 2008

    Accepted: --

    Published Online: Sep. 11, 2008

    The Author Email: Kun Yang (yyyk2002@163.com)

    DOI:10.3788/COL20080609.0673

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