Acta Optica Sinica, Volume. 40, Issue 7, 0711003(2020)

A Dark-Field Detection Algorithm to Detect Surface Contamination in Large-Aperture Reflectors

Zhaoyang Yin1, Dezhi Zhang1, Linjie Zhao1,2, Mingjun Chen1、*, Jian Cheng1、**, Xiaodong Jiang2, Xinxiang Miao2, and Longfei Niu2
Author Affiliations
  • 1School of Mechatronics Engineering, Harbin Institute of Technology, Harbin, Heilongjiang 150001, China
  • 2Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
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    In this study, the dark-field detection algorithm, which is suitable for the detection of contaminants, is investigated in accordance with the imaging characteristics of the surface contaminants of the large-aperture reflector. In this algorithm, the autofocus algorithm is considered during the image acquisition process, whereas the distortion correction and pollutant extraction algorithms are considered during the image processing process. Further, the Tenengrad function is selected to evaluate the sharpness during the autofocus process, and a coarse-precision peak search strategy is proposed to improve the focusing accuracy. Based on the distortion model, the distortion correction algorithm calculates the distortion model coefficients in accordance with the projective transformation properties of the calibration plate corner points and implements image distortion correction. The root mean square error of the correction result is 3.3092 pixel. In the contaminant extraction algorithm, the top-hat transform is employed to eliminate the image background, and the Laplacian weighted adaptive binarization algorithm is used to extract contaminants from the background-removed image. The algorithm is effective for the image with small-sized pollutants in case of uneven illumination. The error in the amount of detected contaminants is 7%. The detection accuracy of the proposed method is better than those of the global threshold algorithm and the mean operator weighted adaptive binarization algorithm. Furthermore, the detection algorithm can provide technical support to evaluate the clean state of the reflector.

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    Zhaoyang Yin, Dezhi Zhang, Linjie Zhao, Mingjun Chen, Jian Cheng, Xiaodong Jiang, Xinxiang Miao, Longfei Niu. A Dark-Field Detection Algorithm to Detect Surface Contamination in Large-Aperture Reflectors[J]. Acta Optica Sinica, 2020, 40(7): 0711003

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    Paper Information

    Category: Imaging Systems

    Received: Sep. 2, 2019

    Accepted: Dec. 12, 2019

    Published Online: Apr. 15, 2020

    The Author Email: Chen Mingjun (chenmj@hit.edu.cn), Cheng Jian (cheng.826@hit.edu.cn)

    DOI:10.3788/AOS202040.0711003

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